The Hitachi S-4700 Type II cold field emission SEM produces high resolution images (1.5nm) at low accelerating voltages and at long working distance. The S-4700 Type II will accommodate specimens up to 150 mm in diameter.
Other features of the S-4700 include full digital imaging, image processing and image archiving. This microscope also features an integrated electron detector for SE, BSE or both at the same time, and complete column set-up through the computer.
The SEM is also equipped with an energy dispersive X-ray analysis system.