Microscopes - SEM

The Hitachi S-4700 Type II cold field emission SEM produces high resolution images (1.5nm) at low accelerating voltages and at long working distance. The S-4700 Type II will accommodate specimens up to 150 mm in diameter. Other features of the S-4700 include full digital imaging, image processing and archiving system, an integrated electron detector for SE, BSE or both at the same time and complete column set-up through the computer. The SEM is also equipped with the Quartz XOne energy dispersive X-ray analysis system. The S-4700 can be accessed via the internet using our EM Anywhere service.